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https://dspace.mnau.edu.ua/jspui/handle/123456789/27343| Title: | Increasing the accuracy of finishing parts of technical systems of the agricultural-industrial complex through thermal-controlled finishing |
| Authors: | Марченко, Дмитро Дмитрович,науковий керівник Marchenko, Dmytro, scientific director Лимар, Олександр Олександрович, науковий керівник Lymar, Oleksandr, scientific director Okhrimenko, І. Bevz, V. |
| Keywords: | agro-industrial complex agricultural machinery finishing polishing precision surfaces lapping thermal deformation temperature polishing pad shape accuracy |
| Issue Date: | 2026 |
| Citation: | Okhrimenko І., Bevz V. Increasing the accuracy of finishing parts of technical systems of the agricultural-industrial complex through thermal-controlled finishing/ наукові керівники D.D Marchenko, О.О. Lymar.Перспективна техніка і технології – 2026 : матеріали ХХІІ міжнародної науково-практичної конференції здобувачів вищої освіти і молодих учених (м. Миколаїв, 22-24 вересня 2026 р.) / Міністерство освіти і науки України ; Миколаївський національний аграрний університет. Миколаїв : МНАУ, 2026. С. 146-149. |
| Abstract: | This study investigates the effect of process medium temperature on the precision of the final machining of components. It was found that the profile of the lapping tool body significantly influences the stability of the finishing process. The most consistent results are achieved with a lapping tool featuring a profile that tapers from the center toward the periphery. The influence of the tool body material and the thickness of the polishing substrate on machining precision was determined. The results obtained can be applied in the manufacture and refurbishment of precision components for agricultural machinery. |
| URI: | https://dspace.mnau.edu.ua/jspui/handle/123456789/27343 |
| Appears in Collections: | Перспективна техніка і технології – 2026 |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| PTT–2026-146-149.pdf | 832,06 kB | Adobe PDF | View/Open |
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